3D Characterization of Nanosystems

Due to scientific development, high-resolution X-ray computed tomography systems can be developed, permitting the internal picturing of materials in three dimensions. However, in order to obtain structural information one also needs proper three-dimensional analysis software. A Nano system publishes significant original work ranging from technologies and systems to product invention and fresh built-up processes with features at the nanoscale.

  • Printed electronics and MEMS (micro-electromechanical system)
  • Diluted magnetic semi-conductors
  • X-ray diffraction
  • Ferromagnetism

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